Publications in Scientific Journals:
T. Ayalew, A. Gehring, J.M. Park, T. Grasser, S. Selberherr:
"Improving SiC Lateral DMOSFET Reliability under High Field Stress";
Microelectronics Reliability,
43
(2003),
9-11;
1889
- 1894.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/S0026-2714(03)00321-4
Online library catalogue of the TU Vienna:
http://aleph.ub.tuwien.ac.at/F?base=tuw01&func=find-c&ccl_term=AC04403712
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2004/JB2003_Ayalew_1.pdf
Created from the Publication Database of the Vienna University of Technology.