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Publications in Scientific Journals:

S. Selberherr:
"Process and Device Modeling for VLSI";
Microelectronics Reliability (invited), 24 (1984), 2; 225 - 257.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/0026-2714(84)90450-5

Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/JB1984_Selberherr_1.pdf


Created from the Publication Database of the Vienna University of Technology.