Publications in Scientific Journals:
A. Schütz, S. Selberherr, H. Pötzl:
"Analysis of Breakdown Phenomena in MOSFET's";
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,
CAD-1
(1982),
2;
77
- 85.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TCAD.1982.1269997
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/JB1982_Schuetz_2.pdf
Created from the Publication Database of the Vienna University of Technology.