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Publications in Scientific Journals:

A. Schütz, S. Selberherr, H. Pötzl:
"Analysis of Breakdown Phenomena in MOSFET's";
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, CAD-1 (1982), 2; 77 - 85.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TCAD.1982.1269997

Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/JB1982_Schuetz_2.pdf


Created from the Publication Database of the Vienna University of Technology.