Books and Book Editorships:
P. Pichler:
"Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon";
in series "Computational Microelectronics",
series editor: S. Selberherr;
Springer-Verlag, Wien - New York,
2004,
ISBN: 978-3-7091-7204-9,
554 pages.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1007/978-3-7091-0597-9
Electronic version of the publication:
http://www.iue.tuwien.ac.at/books/intrinsic_pointdefects/
Created from the Publication Database of the Vienna University of Technology.