Talks and Poster Presentations (with Proceedings-Entry):
A. Gehring, S. Selberherr:
"Modeling of Wearout, Leakage, and Breakdown of Gate Dielectrics";
Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Hsinchu;
2004-07-05
- 2004-07-08; in: "11th International Symposium on the Physical & Failure Analysis of Integrated Circuits",
(2004),
ISBN: 0-7803-8454-7;
61
- 64.
Online library catalogue of the TU Vienna:
http://aleph.ub.tuwien.ac.at/F?base=tuw01&func=find-c&ccl_term=AC04967570
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2005/CP2004_Gehring_1.pdf
Related Projects:
Project Head Siegfried Selberherr:
SIM
Created from the Publication Database of the Vienna University of Technology.