Talks and Poster Presentations (with Proceedings-Entry):
H. Ceric, R. Sabelka, S. Holzer, W. Wessner, S. Wagner, T. Grasser, S. Selberherr:
"The Evolution of the Resistance and Current Density During Electromigration";
Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Munich, Germany;
2004-09-02
- 2004-09-04; in: "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)",
Springer,
(2004),
ISBN: 3211224688;
331
- 334.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1007/978-3-7091-0624-2_78
Online library catalogue of the TU Vienna:
http://aleph.ub.tuwien.ac.at/F?base=tuw01&func=find-c&ccl_term=AC04967640
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2005/CP2004_Ceric_1.pdf
Related Projects:
Project Head Erasmus Langer:
MULSIC
Created from the Publication Database of the Vienna University of Technology.