Publications in Scientific Journals:
T. Ayalew, A. Gehring, T. Grasser, S. Selberherr:
"Enhancement of Breakdown Voltage for Ni-SiC Schottky Diodes Utilizing Field Plate Edge Termination";
Microelectronics Reliability,
44
(2004),
9-11;
1473
- 1478.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2004.07.042
Online library catalogue of the TU Vienna:
http://aleph.ub.tuwien.ac.at/F?base=tuw01&func=find-c&ccl_term=AC04967653
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2005/JB2004_Ayalew_1.pdf
Related Projects:
Project Head Tibor Grasser:
TCAD Mikroelektronik - Christian Doppler Laboratorium Technologie-CAD in der Mikroelektronik
Created from the Publication Database of the Vienna University of Technology.