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Talks and Poster Presentations (without Proceedings-Entry):
A. Gehring, S. Selberherr:
"Statistical Simulation of Gate Dielectric Wearout, Leakage, and Breakdown";
Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Zürich; 2004-10-04 - 2004-10-08.

Related Projects:
Project Head Siegfried Selberherr:
SIM

Created from the Publication Database of the Vienna University of Technology.