Publications in Scientific Journals:
A. Gehring, S. Selberherr:
"Statistical Simulation of Gate Dielectric Wearout, Leakage, and Breakdown";
Microelectronics Reliability,
44
(2004),
9-11;
1879
- 1884.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2004.07.101
Online library catalogue of the TU Vienna:
http://aleph.ub.tuwien.ac.at/F?base=tuw01&func=find-c&ccl_term=AC04967672
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2005/JB2004_Gehring_1.pdf
Related Projects:
Project Head Siegfried Selberherr:
SIM
Created from the Publication Database of the Vienna University of Technology.