Talks and Poster Presentations (without Proceedings-Entry):
T. Ayalew, A. Gehring, T. Grasser, S. Selberherr:
"Enhancement of Breakdown Voltage for Ni-SiC Schottky Diodes Utilizing Field Plate Edge Termination";
Poster: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF),
Zürich;
2004-10-04
- 2004-10-08.
Related Projects:
Project Head Tibor Grasser:
TCAD Mikroelektronik - Christian Doppler Laboratorium Technologie-CAD in der Mikroelektronik
Created from the Publication Database of the Vienna University of Technology.