Talks and Poster Presentations (with Proceedings-Entry):
A. Gehring, S. Selberherr:
"Gate Leakage Models for Device Simulation";
Talk: International Conference on Solid State and Integrated Circuit Technology (ICSICT),
Beijing (invited);
2004-10-18
- 2004-10-21; in: "7th International Conference on Solid-State and Integrated Circuits Technology Proceedings",
R. Huang, M. Yu, J. Liou, T. Hiramoto, C. Claeys (ed.);
IEEE Press,
Volume II
(2004),
ISBN: 0-7803-8511-x;
971
- 976.
Online library catalogue of the TU Vienna:
http://aleph.ub.tuwien.ac.at/F?base=tuw01&func=find-c&ccl_term=AC04967697
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2005/CP2004_Gehring_3.pdf
Related Projects:
Project Head Siegfried Selberherr:
SIM
Created from the Publication Database of the Vienna University of Technology.