Zeitschriftenartikel:
P. Haumer, H. Hauser, P.L. Fulmek, D. Bajalan:
"Hysteresis Modeling of Thin Permalloy Films and Parameter Interpretation";
IEEE Transactions on Magnetics,
40
(2004),
4;
S. 2745
- 2747.
Kurzfassung englisch:
An energetic model is used to calculate macroscopic magnetization behavior of thin Permalloy films. Therefore it is extended by magnetocrystalline anisotropy energy and domain classes that particularly represent magnetization rotation. Some model parameters can be related to coherent rotation of domain magnetizations. A qualitative agreement is achieved with measurements on sputtered Permalloy films used for anisotropic magnetoresistance (AMR) sensors.
Erstellt aus der Publikationsdatenbank der Technischen Universität Wien.