Contributions to Books:
M. Karner, S. Holzer, W. Gös, M. Vasicek, M. Wagner, H. Kosina, S. Selberherr:
"Numerical Analysis of Gate Stacks";
in: "Physics and Technology of High-k Gate Dielectrics 4, Vol. 3 No. 3",
S. Kar, S. De Gendt, M. Houssa, H. Iwai, D. Landheer, D. Misra (ed.);
issued by: The Electrochemical Society;
ECS Transactions,
2006,
ISBN: 1-56677-503-5,
299
- 308.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1149/1.2355721
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2007/JB2006_Karner_3.pdf
Created from the Publication Database of the Vienna University of Technology.