Contributions to Books:
E. Ungersböck, V. Sverdlov, H. Kosina, S. Selberherr:
"Low-Field Electron Mobility in Stressed UTB SOI MOSFETs for Different Substrate Orientations";
in: "SiGe and Ge: Materials, Processing, and Devices, Vol. 3, No. 7",
D. Harame, J. Boquet, M. Caymax, J. Cressler, H. Iwai, S. Koester, G. Masini, J. Murota, A. Reznicek, K. Rim, B. Tillack, S. Zaima (ed.);
issued by: The Electrochemical Society;
ECS Transactions,
2006,
ISBN: 1-56677-507-8,
45
- 54.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1149/1.2355793
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2007/JB2006_Ungersboeck_3.pdf
Created from the Publication Database of the Vienna University of Technology.