Publications in Scientific Journals:
V. Sverdlov, H. Kosina, S. Selberherr:
"Modeling Current Transport in Ultra-Scaled Field-Effect Transistors";
Microelectronics Reliability (invited),
47
(2006),
1;
11
- 19.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2006.03.009
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2007/JB2006_Sverdlov_1.pdf
Created from the Publication Database of the Vienna University of Technology.