Editorials in Scientific Journals:
T. Grasser, S. Selberherr:
"Modelling the Negative Bias Temperature Instability (Editorial)";
Microelectronics Reliability,
47
(2007),
6;
839
- 840.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2006.10.005
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2007/edit2006_Grasser_1.pdf
Created from the Publication Database of the Vienna University of Technology.