Contributions to Books:
B. Kaczer, T. Grasser, R. Fernandez, G. Groeseneken:
"Toward Understanding the Wide Distribution of Time Scales in Negative Bias Temperature Instability";
in: "Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 9",
R. Sah, J. Zhang, Y. Kamakura, M. Deen, J. Yota (ed.);
ECS Transactions,
Pennington,
2007, (invited),
ISBN: 978-1-56677-552-6,
265
- 281.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1149/1.2728801
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2007/KACZER07.pdf
Created from the Publication Database of the Vienna University of Technology.