Talks and Poster Presentations (with Proceedings-Entry):
T. Grasser, B. Kaczer, Ph. Hehenberger, W. Gös, R. Connor, H. Reisinger, W. Gustin, C. Schlünder:
"Simultaneous Extraction of Recoverable and Permanent Components Contributing to Bias-Temperature Instability";
Talk: IEEE International Electron Devices Meeting (IEDM),
Washington, DC, USA;
2007-12-10
- 2007-12-12; in: "Proceedings of the IEEE International Electron Devices Meeting (IEDM)",
(2007),
ISBN: 1-4244-1508-x;
801
- 804.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IEDM.2007.4419069
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2008/CP2007_Grasser_2.pdf
Created from the Publication Database of the Vienna University of Technology.