Talks and Poster Presentations (with Proceedings-Entry):
H. Ceric, R. Orio, S. Selberherr:
"Comprehensive Modeling of Electromigration Induced Interconnect Degradation Mechanisms";
Talk: International Conference on Microelectronics (MIEL),
Nis (invited);
2008-05-11
- 2008-05-14; in: "Proceedings of the International Conference on Microelectronics (MIEL)",
(2008),
ISBN: 978-1-4244-1881-7;
69
- 76.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/ICMEL.2008.4559225
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2008/CP2008_Ceric_1.pdf
Created from the Publication Database of the Vienna University of Technology.