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M. Kirschner, D. Süss, T. Schrefl, J. Fidler, J.N. Chapman:
"Micromagnetic calculation of bias field and coercivity of polycrystalline ferromagnetic/antiferromagnetic layers";
IEEE Transactions on Magnetics, 39 (2003), No. 5; S. 2735 - 2737.

Micromagnetic calculation of bias field and coercivity of polycrystalline ferromagnetic/antiferromagnetic layers
Kirschner, M. Suess, D. Schrefl, T. Fidler, J. Chapman, J.N.
Inst. of Solid State Phys., Vienna Univ. of Technol., Austria;
This paper appears in: Magnetics, IEEE Transactions on

Publication Date: Sept. 2003
On page(s): 2735- 2737
Volume: 39, Issue: 5
ISSN: 0018-9464
INSPEC Accession Number: 7782905
Abstract:
Domain processes associated with exchange bias in ferromagnetic /antiferromagnetic layers are investigated using a micromagnetic approach. The model gives quantitative estimates of the bias field and the coercivity for bilayers with fully compensated interfaces. Both simulations and transmission electron microscopy studies of IrMn-NiFe systems show 360/spl deg/ wall loops and 360/spl deg/ wall segments during the reversal of the F layer. The calculated bias field is in range of /spl mu//sub 0/H/sub eb/=3 mT to /spl mu//sub 0/H/sub eb/=20 mT. The bias field shows a maximum as a function of the antiferromagnet (AF) thickness. It increases sharply with increasing AF thickness at low thicknesses and decreases moderately with increasing AF thickness at higher thicknesses.

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