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D. Süss, M. Kirschner, T. Schrefl, W. Scholz, R. Dittrich, H. Forster, J. Fidler:
"Micromagnetic calculations of bias field and coercivity of compensated ferromagnetic antiferromagnetic bilayers";
Journal of Applied Physics, 93 (2003), No. 10; 8618 - 8620.

Micromagnetic calculations of bias field and coercivity of compensated ferromagnetic antiferromagnetic bilayers

Dieter Suess, Markus Kirschner, Thomas Schrefl, Werner Scholz, Rok Dittrich, Hermann Forster, and Josef Fidler
Solid State Physics, Vienna University of Technology, Vienna, Austria

Exchange bias in polycrystalline IrMn/NiFe was found at perfectly compensated interfaces. The energy associated with unidirectional anisotropy is stored in lateral domain walls in the antiferromagnet. In addition to exchange bias, this mechanism leads to a training effect. The bias field shows a maximum of µ0Hb = 4 mT at an antiferromagnetic layer thickness of 22 nm. The coercivities are on the order of µ0Hc = 10 mT. The coercive field increases with decreasing intergrain exchange interactions within the ferromagnet. ©2003 American Institute of Physics.

http://aleph.ub.tuwien.ac.at/F?base=tuw01&func=find-c&ccl_term=AC04970148

http://link.aip.org/link/?JAP/93/8618&agg=silverplatter