Publications in Scientific Journals:
M. Stöger-Pollach, C. Hébert, H.W. Zandbergen, P. Schattschneider:
"Thickness dependent loss function of Si with 0.14 eV energy resolution";
Advanced Engineering Materials,
6
(2004),
No. 10;
826
- 828.
English abstract:
blank
Communication
Thickness Dependent Loss Function of Si with 0.14 eV Energy Resolution
M. Stöger-Pollach *, C. Hebert 1, H.W. Zandbergen 2, P. Schattschneider 1
1Vienna University of Technology, Vienna, Austria
2Delft University of Technology, Delft, The Netherlands
email: M. Stöger-Pollach (stoeger@ustem.tuwien.ac.at)
*Correspondence to M. Stöger-Pollach, 1Vienna University of Technology, Vienna, Austria
Keywords
EELS . Electronic properties . Semiconductors
Abstract
No abstract.
Online library catalogue of the TU Vienna:
http://aleph.ub.tuwien.ac.at/F?base=tuw01&func=find-c&ccl_term=AC04970288
Electronic version of the publication:
http://www3.interscience.wiley.com/cgi-bin/abstract/109746858/ABSTRACT
Created from the Publication Database of the Vienna University of Technology.