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W.S.M. Werner, W. Smekal, H. Störi, Hp. Winter, G. Stefani, A. Ruocco, F. Offi, R. Gotter, A. Morgante, F. Tommasini:
"Emission-Depth-Selective Auger Photoelectron Coincidence Spectroscopy";
Elettra Research Highlights, 2004-2005 (2005), 27 - 29.

Electron spectroscopy is a well-established
tool for investigating the electronic, structural
and magnetic properties of materials in
various aggregation states. New solid state
systems that hold the promise of entirely
new approaches to technological applications
are increasingly complex and typically
confined in overlayer/interface assembled
structures or thin multilayers, both on the
nanometer scale and including a large number
of constituent in a variety of chemical
states. Therefore, there exists a compelling
need for techniques that can explore the
local electronic structure of individual constituents
with increasing discrimination.
In conventional electron spectroscopy the
average probing depth can be varied by
changing the photoelectron kinetic energy
and take-off angle. However, it is not possible
in this way to directly select the depth
range of photoelectrons accepted for analysis
with a resolution better than the mean
free path. This poses severe restrictions for
calibrating the depth scale of nano-systems
where a depth resolution significantly smaller
than the electron mean free path is of
great interest.

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