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P. Schattschneider, C. Hébert, M. Stöger-Pollach:
"Electron energy-loss spectrometry for metals: some thoughts beyond microanalysis";
International Journal of Materials Research, 97 (2006), 7; 920 - 927.

Electron energy-loss spectrometry for metals: some thoughts beyond microanalysis

Dedicated to Professor Dr. Knut Urban on the occasion of his 65th birthday

The established technique of electron energy-loss spectrometry (EELS) in the electron microscope has surpassed the task of chemical microanalysis. Some aspects of EELS, such as low energy losses for optical studies, have a long tradition and we see them re-emerge after a long period of oblivion. Other aspects such as coherence of inelastically scattered electrons are now much better understood and can be used to advantage. Many applications of EELS can and will profit from the enormous progress in instrumentation and computing capacity. In this paper we discuss some unconventional examples of EELS beyond chemical microanalysis.

From P. Schattschneider a,b | C. Hébert a | M. Stöger-Pollach b
a Institut für Festkörperphysik, Technische Universität Wien, Austria
b Univ. Service Centre for Transmission Electron Microscopy, Technische Universität Wien, Austria

Appeared in International Journal of Materials Research 2006/07, Page 920-927

http://aleph.ub.tuwien.ac.at/F?base=tuw01&func=find-c&ccl_term=AC06588070

http://www.ijmr.de/directlink.asp?MK101320