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D. Eyidi, C. Hébert, P. Schattschneider:
"Short note on parallel illumination in the TEM";
Ultramicroscopy, 106 (2006), 11-12; S. 1144 - 1149.

Short note on parallel illumination in the TEM

D. Eyidi a, C. Hébert b and P. Schattschneider a, b

a University Service Center for Transmission Electron Microscopy, Vienna University of Technology, Wiedner Hauptstrasse 8-10, A-1040 Wien, Austria
b Institute for Solid State Physics, Vienna University of Technology, Wiedner Hauptstrasse 8-10, A-1040 Wien, Austria

Received 20 September 2005; revised 16 February 2006; accepted 5 April 2006. Available online 5 July 2006.

Abstract

Parallel illumination conditions are required for several experiments in the transmission electron microscope (TEM).

The image rotation induced by the helical trajectory of electrons passing through the magnetic field of the TEM lenses inevitably induces an inclination of the beam relative to the optical axis in the object plane-even for an electron which travels parallel to the optical axis in the far field. This angle (shear angle) is vectorially added to the convergence angle; it depends both on the distance to the optical axis and the magnetic field.
By using a beam tilt compensation method, the minimum shear angle is found to be of the order of 1 mrad for a field of view of 2 μm in a 200 kV TEM. In practice, "parallel illumination" can only be obtained for fields of view <= 1 μm.

Keywords: Image rotation; Convergence angle; Magnetic field; Tilt angle; Helical distortion

PACS classification codes: 41.75.Fr; 61.14.Lj; 07.78; 14.60.Cd

Image rotation; Convergence angle; Magnetic field; Tilt angle; Helical distortion

http://aleph.ub.tuwien.ac.at/F?base=tuw01&func=find-c&ccl_term=AC06588093

http://dx.doi.org/10.1016/j.ultramic.2006.04.029