[Zurück]

W.S.M. Werner:
"Partial Intensity Analysis for Quantitative Interpretation of Surface Electron Spectra";
Vortrag: Invited lecture, Workshop Modeling and Data for Electron Spectroscopies: Standardization of Surface Analysis Techniques, Brussels/BE (eingeladen); 14.09.2006.

Quantitative interpretation of electron
spectra obtained on solid surfaces requires detailed understanding of the interaction
of the signal electrons with the solid. Since electrons have a finite rest mass,
they experience multiple scattering in the solid. The theory for multiple scattering
will be reviewed and rigorous spectrum processing methods based on it will be introduced.
Key quantities for the spectrum processing methods developed on this basis are the
so-called partial intensities, i.e. the number of signal electrons that arrive in
the detector after experiencing a certain number of inelastic collisions of a certain
type (e.g. volume, surface or intrinsic scattering). Applications of the outlined
approach to surface analytical techniques such as elastic peak electron spectroscopy
(EPES), Reflection electron energy loss spectroscopy (REELS), Auger electron spectroscopy
(AES), x-ray photoelectron spectrocopy (XPS), and Auger-Photoelectron coincidence
spectroscopy (APECS) will be presented and illustrated with applications to experimental
data.