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W.S.M. Werner, J. Zemek, P. Jiricek:
"Measurement of the differential electron surface and volume excitation probability in Cu, CuO and Cu₂O";
Surface and Interface Analysis, 38 (2006), 628 - 631.

Reflection electron energy loss spectra (REELS) were measured for Cu and in situ-grown Cu2O and CuO.The differential surface and volume inelastic excitation probability is extracted from the REELS using arigorous procedure developed recently. The resulting surface and volume loss probabilities for Cu agreequantitatively with theoretical calculations based on optical data. The resulting loss distributions can beused for a rigorous line shape analysis of XPS and AES spectra of these materials.

http://aleph.ub.tuwien.ac.at/F?base=tuw01&func=find-c&ccl_term=AC06588121