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Zeitschriftenartikel:

L. Köver, M.A. Novak, S. Egri, I. Cserny, Z. Berényi, J. Tóth, D. Varga, W. Drube, F. Yubero, S. Tougaard, W.S.M. Werner:
"Intrinsic and extrinsic excitations in deep core photoelectron spectra of solid Ge";
Surface and Interface Analysis, 38 (2006), S. 569 - 573.



Kurzfassung englisch:
In the quantitative analysis of buried interfaces or the exploration of local electronic structures aroundcomponent atoms in bulk solids, spectroscopy of transitions in the deep atomic core has an increasinglysignificant role to play.Akey issue inunderstanding the deep core photoelectron spectra is the identificationand separation of the contributions that are attributable to different excitations leading to loss of energyof the emitted photoelectrons. In this work, Ge 1s and 2s photoelectron spectra are analyzed using variousmodels to interpret the measured spectral shapes. A detailed comparison of the results derived from thedifferent approaches is presented.

Schlagworte:
Keywords: X-Ray photoelectron spectra; intrinsic loss; extrinsic loss


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Erstellt aus der Publikationsdatenbank der Technischen Universität Wien.