S.D. Findlay, P. Schattschneider, L.J. Allen:
"Imaging using inelastically scattered electrons in CTEM and STEM geometry";
Ultramicroscopy, 108 (2007), S. 58 - 67.

Kurzfassung englisch:

It is shown that energy filtered transmission electron microscopy images are closely related to energy spectroscopic scanning transmission electron microscopy images. For the case of a single atom, we explore this similarity using both the coupled channels and density matrix approaches. We extend the result to the crystal case and find that the similarity persists, the limiting effects due to energy differences in the scattered electrons being small for typical specimen thicknesses in high-resolution transmission electron microscopy.

Electron energy loss spectroscopy; Transmission electron microscopy; Reciprocity

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Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.