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W. Meissl, D. Winklehner, F. Aumayr, M. Simon, R. Ginzel, J.R. Crespo López-Urrutia, J. Ullrich, B. Solleder, C. Lemell, J. Burgdörfer:
"Electron Emission from Insulators Irradiated by Slow Highly Charged Ions";
e-Journal of Surface Science and Nanotechnology, 6 (2008), 54 - 59.

Total electron emission yields have been measured for the first time resulting from impact of slow highly charged
Arq+ (q ! 17), Xeq+ (q ! 50) and Hgq+ (q ! 68) ions on clean insulating LiF(001) and CaF2(111) surfaces at
various impact angles. The surprisingly large yields show that even for the highest projectile charge states, a
local charge-up of the surface poses no barrier for electron emission. We demonstrate that this is due to a strong
sub-surface contribution in the potential electron emission process which is considerably more efficient in insulators
because of the increased inelastic mean free path and the production of secondary electrons.
[DOI: 10.1380/ejssnt.2008.54]

Electron emission measurements; Alkali halides; Single crystal surfaces; Auger ejection; Ion-solid interactions;