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Talks and Poster Presentations (with Proceedings-Entry):

C. Scherrer, A. Steininger:
"How does Resource Utilization Affect Fault Tolerance?";
Talk: International Symp. on Defect and Fault Tolerance in VLSI-Systems, Mt. Fuji, Yamanashi, Japan; 2000-10-02 - 2000-10-06; in: "PROCEEDINGS", (2000), 418 - 425.


Created from the Publication Database of the Vienna University of Technology.