Talks and Poster Presentations (with Proceedings-Entry):
C. Scherrer, A. Steininger:
"How does Resource Utilization Affect Fault Tolerance?";
Talk: International Symp. on Defect and Fault Tolerance in VLSI-Systems,
Mt. Fuji, Yamanashi, Japan;
2000-10-02
- 2000-10-06; in: "PROCEEDINGS",
(2000),
418
- 425.