Talks and Poster Presentations (with Proceedings-Entry):

S. Blanc, A. Ademaj, H. Sivencrona, P. Gil, J. Torin:
"Three Different Fault Injection Techniques Combined to Improve the Detection Efficiency for Time-Triggered Systems";
Talk: IEEE International Workshop on Desgin & Diagnostic of Electronic Circuits and Systems, Brno, Czech Republic; 2002-04-17 - 2002-04-19; in: "Proceedings of the 5th IEEE International Workshop on Design & Diagnostic of Electronic Circuits and Systems", (2002).

English abstract:
In this work we propose the use of three different fault injection techniques, selected to reach a high conformance and confidence of the test results, for valuation of system architecture. Pin-level, software implemented and heavy-ion fault injection are applied in the distributed Time-Triggered Architecture. It is shown the necessity of taking specific attributes of the fault injection techniques into account and relates them to each other, to achieve more realistic error detection coverage and better knowledge about the origin of the faults. The combined injection of different techniques will reveal the origin of deficiencies and discrepancies that might have not been possible to detect using only one fault injection technique. This is the first conclusion about the fault injection process of an on going cooperative work

Electronic version of the publication:

Created from the Publication Database of the Vienna University of Technology.