Talks and Poster Presentations (with Proceedings-Entry):
S. Pitzek, P. Puschner:
"Function Test Framework for Testing IO-Blocks in a Model-Based Rapid Prototyping Development Environment for Embedded Control Applications";
Talk: Workshop on Intelligent Solutions in Embedded Systems,
2003-06-27; in: "Proceedings of the First Workshop on Intelligent Solutions in Embedded Systems",
W. Elmenreich (ed.);
Testing and verification are important methods for gaining confidence in the reliability of a software product. Keeping this confidence up is especially difficult for software that has to follow fast changing development cycles or that is targeted at many platforms. In this paper we present a test framework for creating and executing function (black-box) tests of I/O control blocks, which are part of a model-based rapid-prototyping development environment for distributed embedded control applications. The framework supports test engineers by trying to minimize their required effort for specification, setup and execution of tests. This is achieved by defining test environment specifications that decouple the test specification from many properties of the test environment. The same mechanisms are also used to improve the test-cycle turn-around time for large test suites by supporting the automated parallelization of tests for efficiently distributing them over the available test hardware.
Electronic version of the publication:
Created from the Publication Database of the Vienna University of Technology.