Contributions to Proceedings:

A. N. Belbachir, M. Lera, A. Fanni:
"An automatic inspection system for the diagnosis of printed circuits based on neural networks";
in: "IEEE Industry Applications Conference 2005", issued by: IAS; IEEE, 2005, 680 - 684.

Online library catalogue of the TU Vienna:

Created from the Publication Database of the Vienna University of Technology.