A. N. Belbachir, M. Lera, A. Fanni:
"An automatic inspection system for the diagnosis of printed circuits based on neural networks";
in: "IEEE Industry Applications Conference 2005", issued by: IAS; IEEE, 2005, 680 - 684.
http://aleph.ub.tuwien.ac.at/F?base=tuw01&func=find-c&ccl_term=AC05936558