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S. Kandl, R. Kirner, P. Puschner:
"Development of a Framework for Automated Systematic Testing of Safety-Critical Embedded Systems";
Vortrag: 4th Workshop on Intelligent Solutions in Embedded Systems - (WISES06), Vienna, Austria; 30.06.2006; in: "4th Workshop on Intelligent Solutions in Embedded Systems (WISES'06), Proceedings of the", (2006).

In this paper we introduce the development of a framework for testing safety-critical embedded systems based on the concepts of model-based testing. In model-based testing the test cases are derived from a model of the system under test. In our approach the model is an automaton model that is automatically extracted from the C source code of the system under test. Besides random test data generation the test case generation uses formal methods, in detail model checking techniques. To find appropriate test cases we use the requirements defined in the system specification. To cover further execution paths we developed an additional, to our best knowledge, novel method based on special structural coverage criteria. We present preliminary results on the model extraction using a concrete industrial case study from the automotive domain.

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