Talks and Poster Presentations (with Proceedings-Entry):
B. Rieder, I. Wenzel, K. Steinhammer, P. Puschner:
"Using a Runtime Measurement Device with Measurement-Based WCET Analysis";
Poster: International Embedded Systems Symposiom (IESS'07),
Irvine, Orange County, in Southern California (USA);
2007-05-30
- 2007-06-01; in: "Embedded System Design: Topics, Techniques and Trends",
Springer Boston,
Volume 231/2007
(2007),
ISBN: 978-0-387-72257-3;
15
- 26.
English abstract:
The tough competition among automotive companies creates a high cost
pressure on the OEMs. Combined with shorter innovation cycles, testing new
safety-critical functions becomes an increasingly difficult issue [4]. In the au-
tomotive industry about 55% of breakdowns can be traced back to problems in
electronic systems. About 30% of these incidents are estimated to be caused by
timing problems [7]. It is necessary to develop new approaches for testing the
timing behavior on embedded and real-time systems.
This work describes the integration of runtime measurements using an ex-
ternal measurement device into a framework for measurement-based worst-case
execution time calculations. We show that especially for small platforms using
an external measurement device is a reasonable way to perform execution time
measurements. Such platforms can be identified by the lack of a time source,
limited memory, and the lack of an external interface. The presented device
uses two pins on the target to perform run-time measurements. It works cy-
cle accurate for frequencies up to 200MHz, which should be sufficient for most
embedded devices.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1007/978-0-387-72258-0_2
Created from the Publication Database of the Vienna University of Technology.