Talks and Poster Presentations (with Proceedings-Entry):

B. Rieder, I. Wenzel, K. Steinhammer, P. Puschner:
"Using a Runtime Measurement Device with Measurement-Based WCET Analysis";
Poster: International Embedded Systems Symposiom (IESS'07), Irvine, Orange County, in Southern California (USA); 2007-05-30 - 2007-06-01; in: "Embedded System Design: Topics, Techniques and Trends", Springer Boston, Volume 231/2007 (2007), ISBN: 978-0-387-72257-3; 15 - 26.

English abstract:
The tough competition among automotive companies creates a high cost
pressure on the OEMs. Combined with shorter innovation cycles, testing new
safety-critical functions becomes an increasingly difficult issue [4]. In the au-
tomotive industry about 55% of breakdowns can be traced back to problems in
electronic systems. About 30% of these incidents are estimated to be caused by
timing problems [7]. It is necessary to develop new approaches for testing the
timing behavior on embedded and real-time systems.
This work describes the integration of runtime measurements using an ex-
ternal measurement device into a framework for measurement-based worst-case
execution time calculations. We show that especially for small platforms using
an external measurement device is a reasonable way to perform execution time
measurements. Such platforms can be identified by the lack of a time source,
limited memory, and the lack of an external interface. The presented device
uses two pins on the target to perform run-time measurements. It works cy-
cle accurate for frequencies up to 200MHz, which should be sufficient for most
embedded devices.

"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)

Created from the Publication Database of the Vienna University of Technology.