M. Stöger-Pollach, P. Schattschneider:
"The influence of relativistic energy losses on bandgap determination using valence EELS";
Ultramicroscopy, 107 (2007), 12; S. 1178 - 1185.

Kurzfassung englisch:
Since monochromated transmission electron microscopes have become available, the determination of bandgaps and optical properties using electron energy loss spectrometry (EELS) has again attracted interest. The underlying idea is very simple: below the bandgap energy no transitions can contribute to the valence EELS signal. However, the bandgap cannot be directly read out from the recorded data. Therefore the optical properties can...

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