Publications in Scientific Journals:
T. Aichinger, M. Nelhiebel, T. Grasser:
"On the Temperature Dependence of NBTI Recovery";
Microelectronics Reliability,
48
(2008),
1178
- 1184.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2008.06.018
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2009/JB2008_Grasser_1.pdf
Created from the Publication Database of the Vienna University of Technology.