[Zurück]


Vorträge und Posterpräsentationen (mit Tagungsband-Eintrag):

F. Aumayr:
"Nanostructures produced by slow highly charged ions";
Vortrag: Invited Plenary Lecture, 17th Intern. Workshop on Inelastic Ion- Surface Collisions (IISC-17), Ile de Porquerolles/F (eingeladen); 25.09.2008; in: "Book of Abstracts, 17th Intern. Workshop on Inelastic Ion- Surface Collisions (IISC-17)", (2008), S. 49.



Kurzfassung englisch:
It is known since decades that irradiation of solid
targets with swift or fast heavy ions can lead to severe
structural modifications at the surface and in the bulk.
These modifications include the formation of latent
tracks in the solid, the creation of hillock- (or crater-)
type nanostructures on the surface, and the occurrence
of phase transitions, e.g. from crystalline to amorphous
or from superconducting to insulating. The formation of
tracks or hillocks is usually linked to a critical energy
loss (dE/dx) of the projectiles and occurs particularly in
insulators (e.g., polymers, oxides, ionic crystals).
Highly charged ions (HCI) carry a large amount of
potential energy. For slow HCI this potential energy
can become comparable to or even considerably exceed
the ions kinetic energy, resulting in additional electron
emission or sputtering (potential electron emission [1],
potential sputtering [2]), phenomena which are usually
dominated by kinetic effects. Upon interaction with
solid surfaces the HCI deposit their potential energy
within a very short time (a few femto-seconds) within a
nanometer size volume close to the surface. It is
therefore not astonishing that similar to the case of
swift heavy ions surface modifications with nanometer
dimensions have also been demonstrated for the impact
of slow highly charged ions on various surfaces (see [3]
and refs. therein).
In this plenary talk the current state of this rather new
field of slow HCI-induced nano-structures will be
reviewed. In particular we will discuss the circumstances
and conditions under which nano-sized features
on particular surfaces due to impact of slow highly
charged ions can be produced and observed by scanning
probe methods (AFM, STM).

Erstellt aus der Publikationsdatenbank der Technischen Universität Wien.