Publications in Scientific Journals:
W. Gös, M. Karner, V. Sverdlov, T. Grasser:
"Charging and Discharging of Oxide Defects in Reliability Issues";
IEEE Transactions on Device and Materials Reliability,
8
(2008),
3;
491
- 500.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TDMR.2008.2005247
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2008/JB2008_Goess_1.pdf
Created from the Publication Database of the Vienna University of Technology.