C. Streli, F. Meirer, G. Pepponi, P. Wobrauschek, U. Fittschen, J.A. Broekaert, G. Zaray, G. Falkenberg, M.A. Zaitz:
"Synchrotron Radiation Induced Total Reflection X-Ray Fluorescence Analysis-Xanes (SRTXRF-XANES)";
Report for IAEA - Technical Meeting on Special Configurations and New Applications of Microanalytical Techniques Based on Nuclear Spectrometry (G4-TM-34787) report;
Total Reflection X-ray Fluorescence Analysis (TXRF) is a well established energy dispersive XRF multielement technique for trace analysis and is specially suited for samples where only small amounts are available. Using Synchrotron radiation as excitation source in TXRF offers several advantages over X-ray tube excitation in TXRF (Total Reflection X-ray Fluorescence Analysis): detection limits in the fg range can be achieved and efficient excitation for low Z as well as high Z elements due to the features of synchrotron radiation like intensive radiation with a wide spectral range. These low detection limits are achieved using a multilayer monochromator. A crystal monochromator selects a smaller energy bandwidth from the white synchrotron spectrum than the multilayer. Though it reduces the intensity it allows absorption spectroscopy measurements (XANES) in fluorescence mode to perform chemical speciation at trace levels. Various applications of K-edge XANES measurements will be shown: Speciation of Arsenic in xylem sap of cucumber plants at concentration levels of 30 ng/g., Fe in aerosols collected in a size fractioning impactor and Fe contamination on Si wafer surfaces at contamination levels of E12 atoms/cm².
Electronic version of the publication:
Created from the Publication Database of the Vienna University of Technology.