Publications in Scientific Journals:
T. Grasser, P.-J. Wagner, Ph. Hehenberger, W. Gös, B. Kaczer:
"A Rigorous Study of Measurement Techniques for Negative Bias Temperature Instability";
IEEE Transactions on Device and Materials Reliability,
8
(2008),
3;
526
- 535.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TDMR.2008.2002353
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2009/JB2008_Grasser_2.pdf
Created from the Publication Database of the Vienna University of Technology.