Publications in Scientific Journals:
T. Grasser, B. Kaczer:
"Evidence That Two Tightly Coupled Mechanisms Are Responsible for Negative Bias Temperature Instability in Oxynitride MOSFETs";
IEEE Transactions on Electron Devices,
56
(2009),
5;
1056
- 1062.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TED.2009.2015160
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2009/JB2009_Grasser_2.pdf
Created from the Publication Database of the Vienna University of Technology.