Talks and Poster Presentations (with Proceedings-Entry):
S. E. Tyaginov, V. Sverdlov, W. Gös, T. Grasser:
"Statistics of Si-O Bond-Breakage Rate Variations induced by O-Si-O Angle Fluctuations";
Talk: International Workshop on Computational Electronics (IWCE),
Beijing, China;
2009-05-27
- 2009-05-29; in: "Proceedings of the International Workshop on Computational Electronics (IWCE)",
(2009),
ISBN: 978-1-4244-3926-3;
29
- 32.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IWCE.2009.5091156
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2009/CP2009_Tyaginov_2.pdf
Created from the Publication Database of the Vienna University of Technology.