Editorials in Scientific Journals:
H. Ceric, S. Selberherr:
"Editorial Preface to the Special Section on Electromigration Published in March 2009";
IEEE Transactions on Device and Materials Reliability,
9
(2009),
2;
103.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TDMR.2009.2020086
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2009/JB2009_Ceric_2.pdf
Created from the Publication Database of the Vienna University of Technology.