Publications in Scientific Journals:
Ph. Hehenberger, P.-J. Wagner, H. Reisinger, T. Grasser:
"On the Temperature and Voltage Dependence of Short-Term Negative Bias Temperature Stress";
Microelectronics Reliability,
49
(2009),
1013
- 1017.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2009.06.040
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2009/JB2009_Hehenberger_1.pdf
Created from the Publication Database of the Vienna University of Technology.