Publications in Scientific Journals:
R. Orio, H. Ceric, S. Selberherr:
"Analysis of Electromigration in Dual-Damascene Interconnect Structures";
Journal Integrated Circuits and Systems,
4
(2009),
2;
67
- 72.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.29292/jics.v4i2.300
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2009/JB2009_Orio_1.pdf
Created from the Publication Database of the Vienna University of Technology.