D. Winkler, R. Hametner, S. Biffl:
"Automation Component Aspects for Efficient Unit Testing";
Talk: IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Mallorca; 2009-09-22 - 2009-09-26; in: "2009 IEEE Conference on Emerging Technologies & Factory Automation", (2009), 978-1-4244-2728-4/1946-0759; 8 pages.